2026年4月20日~22日にイタリアで開催された 4th Workshop on Nano Security: From Nano-Electronics to Secure Systems (NanoSec’26) co-located with Design Automation and Test in Europe (DATE) Conference. で，松林 由佑君(M2)が研究成果を発表しました．
Yusuke Matsubayashi, Kazuki Minamiguchi, Hirose Nishikawa, Yoshihiro Midoh, Noriyuki Miura, Jun Shiomi, “Modeling of Tamper Resistance to Correlative Electromagnetic Analysis for Voltage-scaled Circuit,” 4th Workshop on Nano Security: From Nano-Electronics to Secure Systems (NanoSec’26) co-located with Design Automation and Test in Europe (DATE) Conference, Apr. 2026.
